Used for measuring the thickness and optical constants of transparent or semi - transparent single film or multilayer.

单层 或多层薄膜的厚度和光学常数的测定.

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Some well - known methods for optical constants measuring include ellipsometer method, transmission spectrum method and so on.

目前,测量薄膜光学特性的方法有偏振测量法 、 透射光谱分析法等.

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