X — Ray Diffraction ( XRD ) spectra indicate that these compounds are single perovskite in structure.

X射线衍射 ( XRD ) 鉴定均为单一相钙钛矿型氧化物.

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And the catalysts structure is characterized by IR, XRD and BET.

并使用IR 、 XRD、BET等 表征手段分析了催化剂的结构与性能.

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By XRD analysis the layer is maily composed of TiN and Ti 2 N.

XRD分析证实膜层结构主要由TiN和Ti2N组成.

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XRD, SEM and EDS are also used to analyze the ceramic powder.

XRD 、 SEM和 EDS分别用于分析和观察抗茵粉体的晶相结构、形貌及其元素成分.

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The analysis of SEM and XRD approved the formation of zeolite.

SEM及XRD分析证实了沸石结晶的生成.

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The microstructure has been studied using SEM, EDS and XRD.

用扫描电镜(SEM) 、 能谱(EDS)和X射线 衍射(XRD)测试其微观结构.

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The phase structure and surfaceappearance were analysed through SEM, EDS, XRD.

应用扫描电镜(SEM) 、 能谱仪(EDS)和X射线 衍射(XRD)等手段分析研究了氧化铝膜的相结构和表面形貌.

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X - ray diffraction ( XRD ) and transmission electron microscopy ( SEM ) to characterization.

X 射线衍射 ( XRD ) 及透射电子显微镜 ( SEM ) 来表征.

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The precursor and powder were characterized by XRD 、 DTA 、 ICP 、 TEM 、 BET.

采用XRD、DTA、ICP、TEM、BET等 手段表征了前驱体和产物的特征.

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The mini X - ray diode ( M - XRD ) was developed, and was used in mini soft X - ray spectrometer.

研制了小型 X 光二极管(XRD ), 可用于小型软 X 光能谱仪.

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The microstructure and electric property of thin films were investigated by XRD and dark conductivity measurements.

利用X射线 衍射仪(XRD)分析退火后的薄膜晶体结构,用电导率测试仪测试其暗电导率.

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The crystallization of three K 2 O - B 2 O 3 - SiO 2 glasses has been studied by using DTA, XRD 、 TEM and SEM technique.

本文利用DTA 、 XRD、TEM、SEM等技术研究了三种K2O-B2O3-SiO2玻璃的析晶性能.

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Composition of inorganic phases and order degree of lamellar structure were characterized by X - ray diffraction ( XRD ).

用XRD表征了合成产物的无机相组成和 层状结构 的有序度.

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Structures and heat performance of the nanocomposites were investigated with XRD, AFM and TGA.

通过XRD, AFM,TGA测试分析了所制备的复合材料的结构与热性能.

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The phase structure and microstructure of materials were study by XRD, IR and SEM.

采用XRD 、 IR及SEM等方法研究材料的相组成与显微结构.

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